Electron microscopy instrumentation

Talos F200X G2 Scanning Transmission Electron Microscope

  • Installed and accepted in December 2021
  • Equipped with a proprietary "XFEG" high brightness Schottky field emission gun 
  • Flexible HT range: 20-200 kV with alignments at both 200kV and 80kV
  • Resolution: 0.12 nm TEM information limit, 0.16 nm at STEM HAADF 
  • Four-channel imaging with four STEM detectors (high-angle annular dark field, medium-angle annular dark field, low-angle annular dark field, and bright field)
  • Fast EDS elemental mapping with pixel dwell times down to 10 μs 
  • High speed, large FOV and high sensitivity with Ceta 16M pixels camera
  • Precise navigation, drift correction and accuracy with the piezo stage
  • TEM/STEM/EDS tomography extends its analytical capabilities to 3D volumes
     

Talos F200X G2 documentation

Talos F200X G2 Scanning Transmission Electron Microscope


JSM-7600 FE SEM

  • Installed in June 2011
  • Shottky, field-emission gun with fully automatic control; Accelerating voltage 0.1 to 30 kV
  • Practical magnification range: 25 to 1,000,000
  • Resolution: 0.8 nm at 30 kV, 1.5 nm at 1 kV, and 5 nm at 100V
  • Four electron image signal detectors: In-lens secondary electron detector, Below-the-lens secondary electron detector, Low angle backscatter electron detector and retractable scanning transmitted electron detector
  • Equipped with Pegasus Apex 2 integrated EDS and EBSD Systems with capabilities of spectral imaging, OIM data collection and analysis with high accuracy and high efficiency
  • A cryo-transfer System (Gatan Alto 2500) allows imaging and analysis of biological and other hydrated specimens
  • Motorized 5-axis stage assures precise, reproducible specimen positioning

JSM-7600 FE SEM


Cryoultramicrotome

  • RMC PT-PC
  • Polymer materials and biological specimens
  • Sections from 10 to 0.005 microns
  • Temperature range from -180 °C to +35 °C

Cryoultramicrotome instrument.


Gold Sputter

  • Used to coat non-conductive samples for SEM

Gold Sputter


JSM - 6510LV SEM

  • Installed in November 2010
  • Tungsten emitter; Accelerating voltage 0.5 to 30 kV
  • Configured to operate in both high vacuum and low vacuum mode, with the pressure range in low-vacuum mode: 1 to 270 Pa
  • Magnification range: 5 to 300,000
  • Resolution in high vacuum mode: 3.0 nm at 30 kV and 15 nm at 1 kV (secondary electron image)
  • Resolution in low vacuum mode: 4.0 nm at 30 kV (backscatter electron image)
  • X-ray energy-dispersive spectrometer (EDS) for elemental spectra, mapping
  • Ease of use software and hardware functions and flexibility for the experienced professional or the novice operator.

JSM – 6510LV SEM


Leica CM1850 Tissue Slicer

  • Accurately and reproducibly slices frozen sections from a block of tissue
  • Temperature-controlled chamber, down to -35 °C

Leica CM1850 Tissue Slicer


Nikon Eclipse LV100D-U Microscope

  • Brightfield and darkfield transmitted and reflected light microscope
  • With fluorescence function,
    • EX: 450-490 nm, DM: 505 nm, BA: 520 nm
    • EX: 510-560 nm, DM: 575 nm, BA: 590 nm
  • Objective lenses available, 5x, 10x 20x, 40x, 100x
  • Nikon Intensilight C-HGFI Fiber optic light source
  • Nikon DS-Ri1 Color Camera (12.7 megapixel CCD)

Nikon Eclipse LV100D-U Microscope


Pie Scientific Tergeo-EM Plasma Cleaner

  • Can be used to remove surface oxides and/or hydrocarbon contaminations on TEM samples, to clean TEM sample holders, or to generate hydroxide functional groups on TEM grids using water vapor plasma
  • Improves chip bonding for microfluidic devices
  • Inner diameter, 110 mm, depth 280 mm
  • Maximum power: 75 Watt
  • Plasma types available: water vapor and Ar-O2

Pie Scientific Tergeo-EM Plasma Cleaner